A new approach to process gamma scattering spectra for aluminum materials
Keywords:
gamma scattering, Monte Carlo simulation, NaI(Tl)
Abstract
In this study, we used Monte Carlo method to simulate each separate component of the gamma scattering spectrum. The gamma rays emitted from a 137Cs source, scatter on aluminum targets and recorded by a NaI(Tl) detector. Based on the distribution characteristics of each scattering component, we propose a new method to analyze scattered gamma spectra. This method was applied for simulated spectra to estimate the material thickness gives good results.
điểm /
đánh giá
Published
2020-09-04
Issue
Section
ORIGINAL RESEARCH